Search results for "Reliability"

Validación del Autoconcepto Forma 5 en Universitarios Peruanos: Una Herramienta para la Psicología Positiva

2015

ResumenEl autoconcepto, aunque central en la psicología tradicional, ha cobrado importancia recientemente en el contexto de la psicología positiva. El Autoconcepto Forma 5 (AF5) es una medida muy utilizada en el contexto hispanohablante. Sin embargo, no existen estudios sobre sus propiedades psicométricas más allá de la fiabilidad en población peruana. El objetivo es presentar las propiedades psicométricas de la escala multidimensional AF5 en universitarios peruanos. Se recogió una muestra de 527 estudiantes universitarios. La encuesta incluyó, además del AF5, medidas de esperanza disposicional y satisfacción con la vida. Se llevó a cabo un análisis factorial confirmatorio para evaluar la v…

Removing the saturation assumption in Bank-Weiser error estimator analysis in dimension three

2020

International audience; We provide a new argument proving the reliability of the Bank-Weiser estimator for Lagrange piecewise linear finite elements in both dimension two and three. The extension to dimension three constitutes the main novelty of our study. In addition, we present a numerical comparison of the Bank-Weiser and residual estimators for a three-dimensional test case.

Partial discharges at different voltage waveshapes: Comparison between two different acquisition systems

2018

In modern HV apparatuses the wide use of electronic converters, increase the stress on the involved insulation systems and thus affect the reliability of the whole power grid. Additionally, such non-sinusoidal voltage shapes contain high gradient flanks that create problems in the detection of partial discharge (PD) activity. The aim of this paper is to discuss the methodology on how to suitably approach PD detection in insulation systems exposed to various voltage waveshapes in general by comparing two different measuring systems. The first one, equipped with a resonant PD decoupler, designed specifically for detection at typical power electronic waveshapes and the other one, based on an a…

Laser Ultrasonics Inspection for Defect Evaluation on Train Wheel

2019

Abstract Passengers’ safety and in-service life of wheelset axles play an important role in railway vehicles. For this reason, periodic inspections are necessary. Among non-destructive techniques, ultrasonic ones are widely applied in this field. The main disadvantage of conventional ultrasonic techniques is that the overall inspection of wheels requires the train to be put out-of-service and disassembly each part, which is time-consuming and expensive. In this paper, a non-conventional non-contact laser ultrasonic inspection for train wheels is proposed. The proposed method uses a laser interferometer to receive the ultrasonic wave without contact. The receiving system allows choosing the …

SiC Power Switches Evaluation for Space Applications Requirements

2016

We have evaluated several SiC power switches available on the market, by defining and performing a global test campaign oriented to Space applications requirements, in order to define their main benefits but also the limits of current SiC technology. This allowed to identify a number of target applications where SiC could be used as a technology push for a new generation of space electronics units. Silicon devices qualified for space systems above 600V for the switches and 1200V for the rectifiers are not available due to performances limitations of Si. Among the typical static and dynamic characterization, we have performed temperature and power stress and HTRB tests. More remarkably, we h…

SiC MOSFET vs SiC/Si Cascode short circuit robustness benchmark

2019

Abstract Nowadays, MOSFET SiC semiconductors short circuit capability is a key issue. SiC/Si Cascodes are compound semiconductors that, in some aspects, show a similar MOSFET behaviour. No interlayer dielectric insulation suggests, in theory, Cascode JFETs as more robust devices. The purpose of this paper is to compare the drift and degradation of two commercial devices static parameters by exposing them to different levels of repetitive 1.5 μs short-circuit campaigns at 85% of its breakdown voltage. Short-circuit time has been set experimentally, and longer times result in catastrophic failure of MOSFET devices due to over self-heating. For this purpose, pre- and post-test short circuit ch…

Partial discharge of gel insulated high voltage power modules subjected to unconventional voltage waveforms

2016

Performances and duration of the new generation of high voltage power electronic components are dependent on dielectric materials aim to insulating their internal terminals. The presence of defects, some due to faults generated during the manufacturing process, but also due to the internal design of layers and connections, can cause local enhancements of electric field and consequently possible activity of partial discharges phenomena or other effects (aging, tracking) that may result in reduction of device reliability. Furthermore, the usage of unconventional voltage waveforms, like square waves or pulse width modulated waves, additionally increases the electrical aging of the insulation s…

High-Performance Flexible Magnetic Tunnel Junctions for Smart Miniaturized Instruments

2018

Deformation of bubbles in silicon gel insulation under an alternating electric field

2019

The behavior of silicone gel under electrical stress plays a significant role in the reliability and durability of high voltage electronic power devices due to its widespread use for the insulation of IGBT modules and other components. The charges accumulation at the bubble boundaries leads to significant displacements due to the establishment of Coulombic forces and the high deformability of colloidal system. The main purpose of this work is to validate a numerical approach useful to investigate, for a given silicone gel, the non-linear relation between the applied HVDC stress and the electric field over an air bubble within the insulation bulk. The analysis has been carried out by means o…

A Novel Fault-Tolerant Routing Algorithm for Mesh-of-Tree Based Network-on-Chips

2019

Use of bus architecture based communication with increasing processing elements in System-on-Chip (SoC) leads to severe degradation of performance and speed of the system. This bottleneck is overcome with the introduction of Network-on-Chips (NoCs). NoCs assist in communication between cores on a single chip using router based packet switching technique. Due to miniaturization, NoCs like every Integrated circuit is prone to different kinds of faults which can be transient, intermittent or permanent. A fault in any one component of such a crucial network can degrade performance leaving other components non-usable. This paper presents a novel Fault-Tolerant routing Algorithm for Mesh-of-Tree …